Biprism electron interferometry with a single atom tip source

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dc.contributor.author Schütz, Georg
dc.contributor.author Rembold, Alexander
dc.contributor.author Pooch, Andreas
dc.contributor.author Meier, Simon
dc.contributor.author Günther, Andreas
dc.contributor.author Stibor, Alexander
dc.date.accessioned 2014-07-03T15:17:44Z
dc.date.available 2014-07-03T15:17:44Z
dc.date.issued 2014
dc.identifier.issn 0304-3991
dc.identifier.uri http://hdl.handle.net/10900/54032
dc.language.iso en de_DE
dc.publisher Elsevier Science Bv de_DE
dc.relation.uri http://dx.doi.org/10.1016/j.ultramic.2014.02.003 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 570 de_DE
dc.subject.ddc 600 de_DE
dc.title Biprism electron interferometry with a single atom tip source de_DE
dc.type Article de_DE
utue.quellen.id 20140610213910_00011 de_DE
utue.publikation.seiten 9-15 de_DE
utue.personen.roh Schuetz, G.
utue.personen.roh Rembold, A.
utue.personen.roh Pooch, A.
utue.personen.roh Meier, S.
utue.personen.roh Schneeweiss, P.
utue.personen.roh Rauschenbeutel, A.
utue.personen.roh Guenther, A.
utue.personen.roh Chang, W. T.
utue.personen.roh Hwang, I. S.
utue.personen.roh Stibor, A.
dcterms.isPartOf.ZSTitelID Ultramicroscopy de_DE
dcterms.isPartOf.ZS-Volume 141 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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