X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

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X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

Author: Raisch, C.; Langheinrich, C.; Werner, R.; Kleiner, R.; Koelle, D.; Glaser, M.; Chasse, T.; Chasse, A.
Tübinger Autor(en):
Kleiner, Reinhold
Kölle, Dieter
Chassé, Thomas
Glaser, Mathias
Werner, Robert
Raisch, Christoph Werner
Published in: Journal of Applied Physics (2013), Bd. 113, Article 063511
Verlagsangabe: Amer Inst Physics
Language: English
Full text: http://dx.doi.org/10.1063/1.4789988
ISSN: 0021-8979
DDC Classifikation: 530 - Physics
Dokumentart: Article
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