Effects of Annealing on Electrode/MoS2 Interfaces Studied by Photoelectron Spectroscopy

dc.contributor.author	Juriatti, Eric
dc.contributor.author	Peisert, Heiko
dc.contributor.author	Scheele, Marcus
dc.contributor.author	Späth, Christoph
dc.date.accessioned	2026-05-05T08:31:24Z
dc.date.available	2026-05-05T08:31:24Z
dc.date.issued	2025
dc.identifier.issn	2637-6113
dc.identifier.uri	http://hdl.handle.net/10900/178913
dc.language.iso	en	de_DE
dc.publisher	Washington : Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acsaelm.5c00799	de_DE
dc.subject.ddc	600	de_DE
dc.title	Effects of Annealing on Electrode/MoS2 Interfaces Studied by Photoelectron Spectroscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20251118000000_01750
utue.publikation.seiten	6484-6490	de_DE
utue.personen.roh	Juriatti, Eric
utue.personen.roh	Spaeth, Christoph
utue.personen.roh	Peisert, Heiko
utue.personen.roh	Scheele, Marcus
dcterms.isPartOf.ZSTitelID	Acs Applied Electronic Materials	de_DE
dcterms.isPartOf.ZS-Issue	14	de_DE
dcterms.isPartOf.ZS-Volume	7	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE